PaZaM-tech (1991) Ltd

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פז"מ-טק (1991) בע"מ





The MadPLL™ :

Sample Imagery



Atomic Force Microscope Image of Calibration Lines


Calibration grid
(100nm tall lines, 2µm apart)
10µm x 10µm
Unidirectional scan
Self oscillation mode, constant probe signal
Z force feedback: frequency
Data taken using MadPLL™ with:
- Nano-HS3 3-axis NanoPositioning system.

Atomic Force Microscope Image of Calibration Pegs


Calibration grid
(100nm tall pegs, spaced 2µm apart)
10µm x 10µm
Unidirectional scan
Self oscillation mode, constant probe signal
Z force feedback: frequency
Data taken using MadPLL™ with:
- Nano-HS3 3-axis NanoPositioning system.

Atomic Force Microscope Image of a Fly Eye


Fly Eye
100µm x 100µm
Bidirectional scan
PLL mode, constant probe signal
Z force feedback: frequency
Data taken using MadPLL™ with:
- Nano-OP30 NanoPositioning system (Z-axis),
- Nano-OP100 NanoPositioning system (XY axes).

Atomic Force Microscope Image of a Fly Eye


3D Rendering of Fly Eye (above)

Atomic Force Microscope Image of a Human Hair


Human hair
100µm x 100µm
Bidirectional scan
Self oscillation mode, constant probe signal
Z force feedback: frequency
Data taken using MadPLL™ with:
- Nano-OP30 NanoPositioning system (Z-axis),
- Nano-OP100 NanoPositioning system (XY axes).

Atomic Force Microscope Image of Uncured PMMA Pattern


Uncured PMMA Pattern
10 µm x 10 µm
Bidirectional scan
Self oscillation mode, constant probe signal
Z force feedback: frequency
Data taken using MadPLL™ with:
- Nano-OP30 NanoPositioning system (Z-axis),
- Nano-OP100 NanoPositioning system (XY axes).

Atomic Force Microscope Image of Uncured PMMA Pattern


3D Rendering of Uncured PMMA Pattern (above)

Atomic Force Microscope Image of an Integrated Circuit


Integrated circuit
100 µm x 100 µm
Bidirectional scan
Self oscillation mode, constant probe signal
Z force feedback: frequency
Data taken using MadPLL™ with:
- Nano-OP30 NanoPositioning system (Z-axis),
- Nano-OP100 NanoPositioning system (XY axes).

Atomic Force Microscope Image of a Calibration Grid


Calibration Grid
40 µm x 40 µm
Unidirectional scan
Self oscillation mode, constant probe signal
Z force feedback: frequency
Data taken using MadPLL™ with:
- Nano-OP30 NanoPositioning system (Z-axis),
- Nano-OP100 NanoPositioning system (XY axes).

Atomic Force Microscope Image of a Calibration Grid


3D Rendering of Calibration Grid (above)

Atomic Force Microscope Image of a Calibration Grid


Calibration Grid
70 µm x 70 µm
Unidirectional scan
PLL mode, constant probe signal
Z force feedback: frequency
Data taken using MadPLL™ with:
- Nano-OP30 NanoPositioning system (Z-axis),
- Nano-OP100 NanoPositioning system (XY axes).

Atomic Force Microscope Image of Etched Structures


Etched structures
80 µm x 80 µm
Bidirectional scan
Self oscillation mode, constant probe signal
Z force feedback: frequency
Data taken using MadPLL™ with:
- Nano-OP30 NanoPositioning system (Z-axis),
- Nano-OP100 NanoPositioning system (XY axes).

The SPIP™ Scanning Probe Image Processor
was used to render these sample images.

Visit the SPIP™ website .

Download the SPIP™ brochure .

===> לחזור <===

מערכות מותאמות לצרכיך תוך 45 יום

פז"מ-טק (1991) בע"מ